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Brand Name : Topfer
Model Number : Top-Smart 1100
Place of Origin : China
MOQ : one set
Price : to be discussed
Payment Terms : T/T
Supply Ability : 10 sets /30 days
Delivery Time : 2 to 3 weeks
Packaging Details : wooden crate
Color : gray
simultaneously measurable : 4-16 power supply products
Altitude : 1.7m
PCBA ATE tester, mobile power supply detection equipment, comprehensive performance test of ATE mobile power supply
Features of the Top-Smart 1100 Power Testing System:
Open:
Universal:
High-Speed:
Constantly improving the quality and practicality of the power automatic testing system is not only the demand of customers but also the direction that Chuangrui strives for. In recent years, the power supply automatic test system has received wide acclaim from customers for its outstanding performance and efficient and stable detection capabilities. With the accumulation of experience and extensive feedback from customers, as well as Chuangrui's exploration and research and development of new technologies, after 20 years of accumulation and development, Chuangrui's power supply automatic test system has become more outstanding and efficient, fully demonstrating the beauty of "intelligent manufacturing" and helping customers "profit" in the future.
Test Items of the Power Testing System Top-Smart 1100:
| Test items | Test items | 
| DC output voltage | Input voltage ramp | 
| DC output current | Input freq. ramp | 
| Peak-Peak noise | Tracking | 
| Transient response time | Short circuit test | 
| Transient spike | Short circuit current | 
| Voltage regulation | OV protection | 
| Current regulation | UV protection | 
| Turn ON time | OL protection | 
| Rise time | OP protection | 
| Fall time | In-test adjustment | 
| Hold-up time | AC cycle drop out | 
| Inrush current test | PLD simulation | 
| Power good signal | GPIB read/write | 
| Power fail signal | 232 read/write | 
| P/S ON signal | USB read/write | 
| Power up sequence | TTL signal control | 
| Power off sequence | Relay control | 
| Effciency | Bar code scan | 
| Input RMS current | Dynamic test | 
| Input power | DC Current under C.V.Mode | 
| Input power factor | DC : specification under C.P.Mode | 
 
 
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